EM’2020

The 17th International Conference on Electron Microscopy (EM’2020) organized jointly by Silesian University of Technology and the Polish Society for Microscopy (PTMi) will be held on June 14th-17th, 2020, in Wisła, Poland. The Conference will provide a platform for electron microscopists, crystallographers, materials scientists, and solid state physicists to discuss methods and techniques used in electron microscopy. The scope of the EM’2020 is to provide a broad overview of the recent achievements in electron microscopy in the three major areas of instruments, methods, and application. The conference program will include plenary lectures, oral and poster presentations covering both the fundamental, theory, instrumentations and applied research.
Conference topics:
• Sample Preparation Techniques,
• Scanning Electron Microscopy (SEM),
• Advances in SEM and FIB,
• Transmission Electron Microscopy (TEM),
• HREM and Novel Techniques,
• In Situ Microscopy,
• Electron Diffraction and Crystallography,
• Electron Backscattering Diffraction,
• Young Session,
• Other
PTMi and EMS members EMS members are entitled to a fee reduction.
More details about the conference can be found on the website https://www.stereology.pl/em-2020